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High Voltage Differential Probes BumbleBee® Series
הצג
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Active Probe SAP2500

  • Over 2.5 GHz bandwidth with ultra-low 1.1 pF input capacitance
  • ±8 V dynamic range and ±12 V offset range for flexible signal capture
  • 1 MΩ input resistance minimizes loading on test circuits
  • Seamless integration with Siglent oscilloscopes via SAPBus interface
  • Compact probe head and full accessory set for dense PCB probing

Differential Active Probe SAP2500D

  • High-speed differential probe with over 2.5 GHz bandwidth for precision signal analysis
  • Low 1 pF input capacitance and ±4 V dynamic range minimize circuit loading
  • ±8 V offset range and <3% gain accuracy for accurate and stable measurements
  • Compact 2.54 mm tip pitch ideal for probing dense PCBs and differential signals
  • Seamless integration with SDS5000X/SDS6000A oscilloscopes via SAPBus interface

High-Speed Differential Probe HSDP4010

  • High Bandwidth Offers a bandwidth greater than 4 GHz, with 4.2 GHz typical.
  • Differential Voltage Range Designed for a differential voltage range of ±8V (16Vpp).
  • Low Noise Features low input-referred noise, less than 2 mV rms and 100 nV/sqrt(Hz) (preliminary).
  • Fast Rise Time Has a rise time of less than 140 ps (preliminary).
  • High CMRR Exhibits high Common Mode Rejection Ratio (CMRR) with >70 dB at DC, >50 dB at 1 MHz, >45 dB at 10 MHz, >35 dB at 100 MHz, >25 dB at 500 MHz and >25 dB at 1 GHz.
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